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扫描大量BLE标签

我正在寻找在单次扫描中扫描大量BLE标签(StickNFind)的可能性.我注意到,当我扫描10秒钟时,我可以轻松地检测到大约20个BLE.当我将扫描间隔增加到大约30秒并尝试扫描大量BLE标签(例如200个标签)时,我在LogCat中看到有关缓冲区溢出(GKI_exception)的错误.这个问题发生在核心Android库的某个地方,我无法调试.附加了确切的错误日志.

11-27 11:39:30.542: D/dalvikvm(1017): GC_CONCURRENT freed 412K, 8% free 9039K/9760K, paused 1ms+1ms, total 16ms
11-27 11:39:30.552: D/BtGatt.GattService(1017): onScanResult() - address=E8:C6:AD:6F:BC:22, rssi=-76
11-27 11:39:30.552: D/BtGatt.btif(1017): btif_gattc_upstreams_evt: Event 4096
11-27 11:39:30.552: D/BtGatt.btif(1017): btif_gattc_add_remote_bdaddr device overwrite idx=10
11-27 11:39:30.552: D/BtGatt.btif(1017): btif_gattc_update_properties BLE device name=n96 len=3 dev_type=2
11-27 11:39:30.552: D/btif_config_util(1017): btif_config_save_file(L153): in file name:/data/misc/bluedroid/bt_config.new
11-27 11:39:30.562: I/bt-hci(1017): BLE HCI(id=62) event = 0x02)
11-27 11:39:30.562: I/bt-hci(1017): btu_ble_process_adv_pkt
11-27 11:39:30.562: I/bt-hci(1017): BLE HCI(id=62) event = 0x02)
11-27 11:39:30.562: I/bt-hci(1017): btu_ble_process_adv_pkt
11-27 11:39:30.592: I/bt-hci(1017): BLE HCI(id=62) event …
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bluetooth-lowenergy android-bluetooth

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